A Constraint-Driven Gate-Level Test Generator
نویسندگان
چکیده
In current paper, a constraint-driven gate-level test generator which operates as a low-level part of a hierarchical datapath test generation system is presented. The low-level test generator generates tests for gate-level structural faults taking into account the functional constraints, which have been previously extracted during high-level path activation. Both, the high-level and the low-level test generators operate on the design model of alternative graphs (AG). Experimental results have been included, showing the acceleration of fault simulation speed on structural AG model compared to the conventional gate-level netlist representation.
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تاریخ انتشار 1996